JN -- Index by Author (Jun 1997; Volume 77, Number 6)

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Index by Author: Jun 1997; 77 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbott, L. F. [Abstract] [Full Text]; Adelson, David W. [Abstract] [Full Text]; Asanuma, Hiroshi [Abstract] [Full Text]
B: Bal, Thierry [Abstract] [Full Text]; Barnes, Steven [Abstract] [Full Text]; Barnes, W.J.P. [Abstract] [Full Text]; Beato, M. [Abstract] [Full Text]; Benardo, Larry S. [Abstract] [Full Text]; Bennett, David J. [Abstract] [Full Text]; Bennett, David J. [Abstract] [Full Text]; Berry, Richard L. [Abstract] [Full Text]; Berthoz, A. [Abstract] [Full Text]; Bigiani, A. [Abstract] [Full Text]; Boudaba, Cherif [Abstract] [Full Text]; Bracci, E. [Abstract] [Full Text]
C: Cardenas, Carla G. [Abstract] [Full Text]; Caria, Marcello A. [Abstract] [Full Text]; Casagrande, Vivien A. [Abstract] [Full Text]; Cattaert, D. [Abstract] [Full Text]; Cekic, Milos [Abstract] [Full Text]; Chandler, S. H. [Abstract] [Full Text]; Chau, David [Abstract] [Full Text]; Chaudhari, N. [Abstract] [Full Text]; Chen, Gong [Abstract] [Full Text]; Clark, V. P. [Abstract] [Full Text]; Crair, Michael C. [Abstract] [Full Text]; Crawley, Adrian P. [Abstract] [Full Text]
D: Datta, Subimal [Abstract] [Full Text]; Davis, Karen D. [Abstract] [Full Text]; Deangelis, Gregory C. [Abstract] [Full Text]; Delay, R. J. [Abstract] [Full Text]; Dessem, Dean [Abstract] [Full Text]; Donga, Revers [Abstract] [Full Text]; Dostrovsky, J. O. [Abstract] [Full Text]; Dougherty, P. M. [Abstract] [Full Text]; Douglas, Andrea F. [Abstract] [Full Text]
E: Ebersberger, A. [Abstract] [Full Text]; Engel, Jerome, Jr. [Abstract] [Full Text]
F: Freeman, Ralph D. [Abstract] [Full Text]; Fried, Itzhak [Abstract] [Full Text]
G: Georges-François, P. [Abstract] [Full Text]; Gillard, Deborah [Abstract] [Full Text]; Gillard, Deborah [Abstract] [Full Text]; Gillespie, Deda C. [Abstract] [Full Text]; Gracely, R. H. [Abstract] [Full Text]; Graf, W. [Abstract] [Full Text]; Grasso, R. [Abstract] [Full Text]
H: Handwerker, H. O. [Abstract] [Full Text]; Hari, Riitta [Abstract] [Full Text]; Hasselmo, Michael E. [Abstract] [Full Text]; Haxby, J. V. [Abstract] [Full Text]; Hidaka, O. [Abstract] [Full Text]; Hidaka, Osamu [Abstract] [Full Text]; Hsiao, C. F. [Abstract] [Full Text]; Hutchison, W. D. [Abstract] [Full Text]
I: Ikegami, H. [Abstract] [Full Text]; Imagawa, M. [Abstract] [Full Text]; Ingeholm, J. [Abstract] [Full Text]; Inoue, T. [Abstract] [Full Text]; Inoue, Tomio [Abstract] [Full Text]; Isokawa, Masako [Abstract] [Full Text]; Israël, I. [Abstract] [Full Text]; Isu, N. [Abstract] [Full Text]; Izumi, Yukitoshi [Abstract] [Full Text]
J: Jacklet, Jon W. [Abstract] [Full Text]; Jiang, Dan [Abstract] [Full Text]
K: Kaas, Jon H. [Abstract] [Full Text]; Kajola, Matti [Abstract] [Full Text]; Kaneko, Takeshi [Abstract] [Full Text]; Kang, Youngnam [Abstract] [Full Text]; Kato, T. [Abstract] [Full Text]; Katsuki, Hiroshi [Abstract] [Full Text]; Kim, Namjin [Abstract] [Full Text]; Kimura, Akihisa [Abstract] [Full Text]; Kinnamon, S. C. [Abstract] [Full Text]; Kobayashi, M. [Abstract] [Full Text]; Kobayashi, Masayuki [Abstract] [Full Text]; Komiyama, T. [Abstract] [Full Text]; Kondoh, Yasuhiro [Abstract] [Full Text]; Kruger, Lawrence [Abstract] [Full Text]
L: Le Beau, Fiona E. N. [Abstract] [Full Text]; Lenz, F. A. [Abstract] [Full Text]; Leopold, D. A. [Abstract] [Full Text]; Levesque, Michel [Abstract] [Full Text]; Levine, M. S. [Abstract] [Full Text]; Li, Chaoying [Abstract] [Full Text]; Linster, Christiane [Abstract] [Full Text]; Luo, Pifu [Abstract] [Full Text]
M: Ma, Daveena [Abstract] [Full Text]; Malmierca, Manuel S. [Abstract] [Full Text]; Mar, Lucinda P. Del [Abstract] [Full Text]; Marchand, A. R. [Abstract] [Full Text]; Masuda, Y. [Abstract] [Full Text]; Masuda, Yuji [Abstract] [Full Text]; Matsuo, R. [Abstract] [Full Text]; Matsuo, Ryuji [Abstract] [Full Text]; McAlpine, David [Abstract] [Full Text]; McCormick, David A. [Abstract] [Full Text]; Mikulis, David J. [Abstract] [Full Text]; Monsivais, P. [Abstract] [Full Text]; Morimoto, T. [Abstract] [Full Text]; Morimoto, Toshifumi [Abstract] [Full Text]; Müller, Thomas H. [Abstract] [Full Text]
N: Newland, Philip L. [Abstract] [Full Text]; Nistri, A. [Abstract] [Full Text]
O: Ohzawa, Izumi [Abstract] [Full Text]
P: Palmer, Alan R. [Abstract] [Full Text]; Park, T. J. [Abstract] [Full Text]; Patil, Madhvi [Abstract] [Full Text]; Peoples, Robert W. [Abstract] [Full Text]; Petit, L. [Abstract] [Full Text]; Pollak, G. D. [Abstract] [Full Text]; Portin, Karin [Abstract] [Full Text]; Preuss, Todd [Abstract] [Full Text]; Prochazka, Arthur [Abstract] [Full Text]; Prochazka, Arthur [Abstract] [Full Text]
R: Reeh, P. W. [Abstract] [Full Text]; Rees, Adrian [Abstract] [Full Text]; Ringkamp, M. [Abstract] [Full Text]; Roper, S. D. [Abstract] [Full Text]; Rosa, Marcello G. P. [Abstract] [Full Text]; Rowland, L. H. [Abstract] [Full Text]; Ruthazer, Edward S. [Abstract] [Full Text]
S: Salenius, Stephan [Abstract] [Full Text]; Salinas, Emilio [Abstract] [Full Text]; Salmelin, Riitta [Abstract] [Full Text]; Sarbaz, Ali [Abstract] [Full Text]; Sasaki, M. [Abstract] [Full Text]; Sato, H. [Abstract] [Full Text]; Schellart, N.A.M. [Abstract] [Full Text]; Schrader, Laura A. [Abstract] [Full Text]; Schramm, Lawrence P. [Abstract] [Full Text]; Scroggs, Reese S. [Abstract] [Full Text]; Segal, Michael M. [Abstract] [Full Text]; Siwek, Donald F. [Abstract] [Full Text]; Smith, George M. [Abstract] [Full Text]; Stein, R. B. [Abstract] [Full Text]; Stryker, Michael P. [Abstract] [Full Text]; Swandulla, D. [Abstract] [Full Text]
T: Takada, K. [Abstract] [Full Text]; Tanelian, Darrell [Abstract] [Full Text]; Tasker, Jeffrey G. [Abstract] [Full Text]; Taylor, Stephen J. [Abstract] [Full Text]; Trueblood, P. R. [Abstract] [Full Text]; Tsoukatos, J. [Abstract] [Full Text]; Tsuzuku, T. [Abstract] [Full Text]
U: Uchino, Y. [Abstract] [Full Text]
V: van den Pol, Anthony N. [Abstract] [Full Text]
W: Wei, Jen Yu [Abstract] [Full Text]; Weight, Forrest F. [Abstract] [Full Text]; Wood, Michael L. [Abstract] [Full Text]; Wubbels, R. J. [Abstract] [Full Text]
Y: Yang, Jay [Abstract] [Full Text]
Z: Zehr, E. P. [Abstract] [Full Text]; Zeilhofer, H. U. [Abstract] [Full Text]; Zirh, T. A. [Abstract] [Full Text]; Zorumski, Charles F. [Abstract] [Full Text]