JN -- Index by Author (Sep 1998; Volume 80, Number 3)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Sep 1998; 80 (3) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adam, Alexander [Abstract] [Full Text]; Aitken, P. G. [Abstract] [Full Text]; Akopian, Abram [Abstract] [Full Text]; Alexander, Garrett E. [Abstract] [Full Text]; Amzica, Florin [Abstract] [Full Text]; Amzica, Florin [Abstract] [Full Text]; Andrade, Rodrigo [Abstract] [Full Text]; Astman, Nadav [Abstract] [Full Text]; Atchison, William D. [Abstract] [Full Text]
B: Baker, S. N. [Abstract] [Full Text]; Barrionuevo, German [Abstract] [Full Text]; Boughter, John D., Jr. [Abstract] [Full Text]; Boussaoud, Driss [Abstract] [Full Text]; Bower, James M. [Abstract] [Full Text]; Brandt, Jason [Abstract] [Full Text]; Bremmer, Frank [Abstract] [Full Text]; Brown, David A. [Abstract] [Full Text]; Brustein, Edna [Abstract] [Full Text]; Burkhardt, Dwight A. [Abstract] [Full Text]
C: Campbell, James N. [Abstract] [Full Text]; Cannestra, Andrew F. [Abstract] [Full Text]; Carette, Bernard [Abstract] [Full Text]; Carlen, Peter L. [Abstract] [Full Text]; Clower, William T. [Abstract] [Full Text]; Collins, J. G. [Abstract] [Full Text]; Contreras, Diego [Abstract] [Full Text]; Copenhagen, David R. [Abstract] [Full Text]; Corkin, Suzanne [Abstract] [Full Text]; Corotto, Frank S. [Abstract] [Full Text]; Cowan, Jack D. [Abstract] [Full Text]; Crane, Benjamin T. [Abstract] [Full Text]; Crawley, Adrian P. [Abstract] [Full Text]
D: Davis, Karen D. [Abstract] [Full Text]; Demer, Joseph L. [Abstract] [Full Text]; Dorris, Michael C. [Abstract] [Full Text]; Dryden, William F. [Abstract] [Full Text]; Dun, N. J. [Abstract] [Full Text]
E: Edelman, Jay A. [Abstract] [Full Text]; Empson, Ruth M. [Abstract] [Full Text]; Erim, Zeynep [Abstract] [Full Text]; Everling, Stefan [Abstract] [Full Text]
F: Fahey, Patrick K. [Abstract] [Full Text]; Fleidervish, Ilya A. [Abstract] [Full Text]; Foster, Thomas C. [Abstract] [Full Text]; Frantseva, Marina V. [Abstract] [Full Text]
G: Gabriel, Robert [Abstract] [Full Text]; Gaymard, Bertrand M. [Abstract] [Full Text]; Gielo-Perczak, Krystyna [Abstract] [Full Text]; Gloveli, Tengis [Abstract] [Full Text]; Goffart, Laurent [Abstract] [Full Text]; Goffart, Laurent [Abstract] [Full Text]; Grenier, François [Abstract] [Full Text]; Guillaume, Alain [Abstract] [Full Text]; Guillaume, Alain [Abstract] [Full Text]; Gutnick, Michael J. [Abstract] [Full Text]
H: Haj-Dahmane, Samir [Abstract] [Full Text]; Hall, Karen E. [Abstract] [Full Text]; Halpain, Shelley [Abstract] [Full Text]; Hartmann, Mitra J. [Abstract] [Full Text]; Heinemann, Uwe [Abstract] [Full Text]; Henze, Darrell A. [Abstract] [Full Text]; Hewett, Sandra J. [Abstract] [Full Text]; Hunter, John D. [Abstract] [Full Text]; Hwang, L. L. [Abstract] [Full Text]; Hwang, Thomas N. [Abstract] [Full Text]
I: Isaacson, Jeffry S. [Abstract] [Full Text]; Ishac, Milad [Abstract] [Full Text]
J: Jouffrais, Christophe [Abstract] [Full Text]
K: Kalaska, John F. [Abstract] [Full Text]; Kautz, Steven A. [Abstract] [Full Text]; Kay, Alan R. [Abstract] [Full Text]; Keller, Edward L. [Abstract] [Full Text]; Kim, Uhnoh [Abstract] [Full Text]; Kishikawa, Kazuhiro [Abstract] [Full Text]; Kwan, Chun L. [Abstract] [Full Text]
L: Lei, Saobo [Abstract] [Full Text]; Lemon, R. N. [Abstract] [Full Text]; Lewis, Richard F. [Abstract] [Full Text]; Litovsky, Ruth Y. [Abstract] [Full Text]; Litovsky, Ruth Y. [Abstract] [Full Text]; Llinás, Rodolfo [Abstract] [Full Text]; Lo, Fu-Sun [Abstract] [Full Text]; Luca, Carlo J. De [Abstract] [Full Text]
M: Mccormick, David A. [Abstract] [Full Text]; Meredith, M. Alex [Abstract] [Full Text]; Meyer, Richard A. [Abstract] [Full Text]; Michel, William C. [Abstract] [Full Text]; Mikulis, David J. [Abstract] [Full Text]; Milton, John G. [Abstract] [Full Text]; Munoz, Douglas P. [Abstract] [Full Text]
N: Neckelmann, Dag [Abstract] [Full Text]; Neckelmann, Dag [Abstract] [Full Text]; Norris, Christopher M. [Abstract] [Full Text]
O: Ota, Kouichi [Abstract] [Full Text]
P: Patla, Aftab E. [Abstract] [Full Text]; Pélisson, Denis [Abstract] [Full Text]; Pélisson, Denis [Abstract] [Full Text]; Pouratian, Nader [Abstract] [Full Text]; Prince, Francois [Abstract] [Full Text]
R: Raasch, Christine C. [Abstract] [Full Text]; Ramoa, Ary S. [Abstract] [Full Text]; Ristic, Helen [Abstract] [Full Text]; Roberts, Elizabeth B. [Abstract] [Full Text]; Rossignol, Serge [Abstract] [Full Text]
S: Schmitz, Dietmar [Abstract] [Full Text]; Sergio, Lauren E. [Abstract] [Full Text]; Shadmehr, Reza [Abstract] [Full Text]; Shomer, Marc H. [Abstract] [Full Text]; Sima, Anders A. F. [Abstract] [Full Text]; Smith, David V. [Abstract] [Full Text]; Smith, Peter A. [Abstract] [Full Text]; Somjen, G. G. [Abstract] [Full Text]; Srinivasan, Shanthi [Abstract] [Full Text]; Steriade, Mircea [Abstract] [Full Text]; Steriade, Mircea [Abstract] [Full Text]; Steriade, Mircea [Abstract] [Full Text]; Steriade, Mircea [Abstract] [Full Text]; Sugimori, Mutsuyuki [Abstract] [Full Text]; Sumino, Rhyuji [Abstract] [Full Text]
T: Tamargo, Rafael J. [Abstract] [Full Text]; Thomas, Peter J. [Abstract] [Full Text]; Tian, Ning [Abstract] [Full Text]; Timofeev, Igor [Abstract] [Full Text]; Timofeev, Igor [Abstract] [Full Text]; Ting, Lena H. [Abstract] [Full Text]; Toga, Arthur W. [Abstract] [Full Text]; Tombaugh, G. C. [Abstract] [Full Text]; Treede, Rolf-Detlef [Abstract] [Full Text]; Turner, D. A. [Abstract] [Full Text]
U: Urban, Nathaniel N. [Abstract] [Full Text]
V: Velazquez, Jose L. Perez [Abstract] [Full Text]
W: Wiley, John W. [Abstract] [Full Text]; Winter, David A. [Abstract] [Full Text]; Witkovsky, Paul [Abstract] [Full Text]
X: Xie, Cui-Wei [Abstract] [Full Text]; Xu, You-Fen [Abstract] [Full Text]
Y: Yagi, Junichi [Abstract] [Full Text]; Yamamori, Yuji [Abstract] [Full Text]; Yanagidani, Tadao [Abstract] [Full Text]; Yin, Tom C. T. [Abstract] [Full Text]; Yin, Tom C. T. [Abstract] [Full Text]; Yu, Tzu-Ping [Abstract] [Full Text]
Z: Zajac, Felix E. [Abstract] [Full Text]; Zhu, J. Julius [Abstract] [Full Text]