JN -- Index by Author (Dec 1998; Volume 80, Number 6)

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Index by Author: Dec 1998; 80 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Ache, Barry W. [Abstract] [Full Text]; Apicella, Paul [Abstract] [Full Text]; Arai, Yasuko [Abstract] [Full Text]; Armstrong-James, Michael [Abstract] [Full Text]; Ascher, Philippe [Abstract] [Full Text]
B: Baker, Curtis L., Jr. [Abstract] [Full Text]; Baraldi, Patrizia [Abstract] [Full Text]; Barbay, Scott [Abstract] [Full Text]; Bastian, Joseph [Abstract] [Full Text]; Beaulieu, C. [Abstract] [Full Text]; Berger, Albert J. [Abstract] [Full Text]; Berman, Neil J. [Abstract] [Full Text]; Berman, Neil J. [Abstract] [Full Text]; Berman, Neil J. [Abstract] [Full Text]; Brody, Carlos D. [Abstract] [Full Text]; Brown, Peter [Abstract] [Full Text]; Buchsbaum, Gershon [Abstract] [Full Text]; Burk, Marcel [Abstract] [Full Text]; Burke, R. E. [Abstract] [Full Text]; Bushnell, M. Catherine [Abstract] [Full Text]; Bütefisch, Cathrin [Abstract] [Full Text]
C: Calejesan, Amelita A. [Abstract] [Full Text]; Campero, Mario [Abstract] [Full Text]; Cettolo, Valentina [Abstract] [Full Text]; Charlton, Milton P. [Abstract] [Full Text]; Chelazzi, Leonardo [Abstract] [Full Text]; Chen, Robert [Abstract] [Full Text]; Cohen, Bernard [Abstract] [Full Text]; Cohen, Ethan D. [Abstract] [Full Text]; Cohen, Leonardo G. [Abstract] [Full Text]; Correia, Manning J. [Abstract] [Full Text]; Corwell, Brian [Abstract] [Full Text]
D: Dalezios, Y. [Abstract] [Full Text]; Dalezios, Y. [Abstract] [Full Text]; Davies, Michelle [Abstract] [Full Text]; Degtyarenko, A. M. [Abstract] [Full Text]; Delemos, K. A. [Abstract] [Full Text]; Desimone, Robert [Abstract] [Full Text]; Diamond, Mathew E. [Abstract] [Full Text]; Dieudonné, Stéphane [Abstract] [Full Text]; Dresse, Albert [Abstract] [Full Text]; Du, F. [Abstract] [Full Text]; Dudel, J. [Abstract] [Full Text]; Duncan, Gary H. [Abstract] [Full Text]; Duncan, John [Abstract] [Full Text]
E: Ebner, Ford F. [Abstract] [Full Text]; Eckert, W. A., III [Abstract] [Full Text]
F: Favorov, O. V. [Abstract] [Full Text]; Feidler, Jordan C. [Abstract] [Full Text]; Feinstein, N. [Abstract] [Full Text]; Feng, A. S. [Abstract] [Full Text]; Francescato, Maria Pia [Abstract] [Full Text]; Frerking, M. [Abstract] [Full Text]
G: Gao, Bao-Xi [Abstract] [Full Text]; Gao, T. M. [Abstract] [Full Text]; Gebhart, G. F. [Abstract] [Full Text]; Gibson, A. R. [Abstract] [Full Text]; Giszter, Simon F. [Abstract] [Full Text]; Gonzalez-Lima, F. [Abstract] [Full Text]; Goodman, J. H. [Abstract] [Full Text]; Grantyn, A. A. [Abstract] [Full Text]; Green, Paul G. [Abstract] [Full Text]; Guertin, P. A. [Abstract] [Full Text]; Gybels, JAN M. [Abstract] [Full Text]
H: Hamm, T. M. [Abstract] [Full Text]; Hari, Riitta [Abstract] [Full Text]; Heide, Wolfgang [Abstract] [Full Text]; Highstein, S. M. [Abstract] [Full Text]; Horn, K. M. [Abstract] [Full Text]; Hoshi, Eiji [Abstract] [Full Text]; Hounsgaard, J. [Abstract] [Full Text]; Howard, E. M. [Abstract] [Full Text]; Hua, Shao-Ying [Abstract] [Full Text]; Huang, Wei [Abstract] [Full Text]; Humphrey, Allen L. [Abstract] [Full Text]; Humphrey, Allen L. [Abstract] [Full Text]
I: Ingham, Neil J. [Abstract] [Full Text]
K: Kargo, William J. [Abstract] [Full Text]; Kleim, Jeffrey A. [Abstract] [Full Text]; Klostermann, Wolfgang [Abstract] [Full Text]; Kömpf, Detlef [Abstract] [Full Text]; Kupers, Ron C. [Abstract] [Full Text]
L: Lacaille, J.-C. [Abstract] [Full Text]; Legallet, Eric [Abstract] [Full Text]; Levine, Jon D. [Abstract] [Full Text]; Li, Ping [Abstract] [Full Text]; Li, Weidong [Abstract] [Full Text]; Light, A. R. [Abstract] [Full Text]; Lin, David C. [Abstract] [Full Text]; Linden, David J. [Abstract] [Full Text]
M: Malenka, R. C. [Abstract] [Full Text]; Maler, Leonard [Abstract] [Full Text]; Maler, Leonard [Abstract] [Full Text]; Maler, Leonard [Abstract] [Full Text]; Marchand, Serge [Abstract] [Full Text]; Mareschal, Isabelle [Abstract] [Full Text]; Massotte, Laurent [Abstract] [Full Text]; McCrossan, Damian [Abstract] [Full Text]; Mcintosh, A. R. [Abstract] [Full Text]; Metz, C. B. [Abstract] [Full Text]; Miller, Earl K. [Abstract] [Full Text]; Moore, Christopher I. [Abstract] [Full Text]; Morin, F. [Abstract] [Full Text]; Moschovakis, A. K. [Abstract] [Full Text]; Moschovakis, A. K. [Abstract] [Full Text]
N: Narasimhan, Kalyani [Abstract] [Full Text]; Nelson, Sacha B. [Abstract] [Full Text]; Nicoll, R. A. [Abstract] [Full Text]; Nudo, Randolph J. [Abstract] [Full Text]
O: Ochoa, José [Abstract] [Full Text]
P: Parnas, D. [Abstract] [Full Text]; Parnas, H. [Abstract] [Full Text]; Parnas, I. [Abstract] [Full Text]; Pessah, Isaac N. [Abstract] [Full Text]; Petit, J. [Abstract] [Full Text]; Porro, Carlo A. [Abstract] [Full Text]
R: Raciborska, Dorota A. [Abstract] [Full Text]; Ramirez, Jan-Marino [Abstract] [Full Text]; Rao-Mirotznik, Rukmini [Abstract] [Full Text]; Raphan, Theodore [Abstract] [Full Text]; Rathouz, Margaret [Abstract] [Full Text]; Ratnam, R. [Abstract] [Full Text]; Ravel, Sabrina [Abstract] [Full Text]; Rema, V. [Abstract] [Full Text]; Rothwell, JOHN C. [Abstract] [Full Text]; Rothwell, John C. [Abstract] [Full Text]; Rymer, W. Zev [Abstract] [Full Text]
S: Salenius, Stephan [Abstract] [Full Text]; Sardo, Pierangelo [Abstract] [Full Text]; Saul, Alan B. [Abstract] [Full Text]; Saul, Alan B. [Abstract] [Full Text]; Scharfman, H. E. [Abstract] [Full Text]; Schneider, S. P. [Abstract] [Full Text]; Schwarcz, R. [Abstract] [Full Text]; Scudder, C. A. [Abstract] [Full Text]; Scuvée-Moreau, Jacqueline [Abstract] [Full Text]; Semple, Malcolm N. [Abstract] [Full Text]; Serra, Jordi [Abstract] [Full Text]; Seutin, Vincent [Abstract] [Full Text]; Shibayama, Motohide [Abstract] [Full Text]; Shima, Keisetsu [Abstract] [Full Text]; Shima, Keisetsu [Abstract] [Full Text]; Simon, E. S. [Abstract] [Full Text]; Slaughter, Malcolm M. [Abstract] [Full Text]; Sommer, Marc A. [Abstract] [Full Text]; Spitzer, Matthew W. [Abstract] [Full Text]; Sterling, Peter [Abstract] [Full Text]; Strausbaugh, Holly J. [Abstract] [Full Text]; Su, X. [Abstract] [Full Text]; Suzuki, Jun-Ichi [Abstract] [Full Text]
T: Tam, Alda [Abstract] [Full Text]; Tanji, Jun [Abstract] [Full Text]; Tanji, Jun [Abstract] [Full Text]; Thornton, Sally K. [Abstract] [Full Text]; Tian, Ning [Abstract] [Full Text]; Tommerdahl, M. [Abstract] [Full Text]; Trimble, William S. [Abstract] [Full Text]; Trussell, Laurence [Abstract] [Full Text]
V: Verleger, Rolf [Abstract] [Full Text]; Vierck, C. J., Jr. [Abstract] [Full Text]; Villemure, Jean-Guy [Abstract] [Full Text]
W: Wachtel, R. E. [Abstract] [Full Text]; Wascher, Edmund [Abstract] [Full Text]; Wauschkuhn, Bernd [Abstract] [Full Text]; Whitsel, B. L. [Abstract] [Full Text]; Withington, Deborah J. [Abstract] [Full Text]; Wurtz, Robert H. [Abstract] [Full Text]
X: Xu, Z. C. [Abstract] [Full Text]
Y: Yakushin, Sergei B. [Abstract] [Full Text]
Z: Zhainazarov, Aslbek B. [Abstract] [Full Text]; Zhang, Jian [Abstract] [Full Text]; Zhuo, Min [Abstract] [Full Text]; Ziemann, Ulf [Abstract] [Full Text]; Ziskind-Conhaim, Lea [Abstract] [Full Text]