JN -- Index by Author (Jun 1999; Volume 81, Number 6)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: Jun 1999; 81 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Andersen, Richard A. [Abstract] [Full Text]; Aniksztejn, Laurent [Abstract] [Full Text]; Apkarian, A. Vania [Abstract] [Full Text]; Ariel, Michael [Abstract] [Full Text]
B: Banks, Robert W. [Abstract] [Full Text]; Belton, T. [Abstract] [Full Text]; Bianchi, Riccardo [Abstract] [Full Text]; Bieda, Mark C. [Abstract] [Full Text]; Boughter, John D., Jr. [Abstract] [Full Text]; Bradley, David C. [Abstract] [Full Text]
C: Calupca, Michelle A. [Abstract] [Full Text]; Carlen, Peter L. [Abstract] [Full Text]; Carp, J. S. [Abstract] [Full Text]; Catarsi, Stefano [Abstract] [Full Text]; Chan, Julie Y. H. [Abstract] [Full Text]; Chan, Samuel H. H. [Abstract] [Full Text]; Chen, X. Y. [Abstract] [Full Text]; Copenhagen, David R. [Abstract] [Full Text]; Currie, Scott N. [Abstract] [Full Text]
D: Dalva, Matthew B. [Abstract] [Full Text]; Darbar, Aneela [Abstract] [Full Text]; Das, Vallabh E. [Abstract] [Full Text]; Deiber, Marie-Pierre [Abstract] [Full Text]; Delemos, K. A. [Abstract] [Full Text]; Delgutte, Bertrand [Abstract] [Full Text]; Dell'Osso, Louis F. [Abstract] [Full Text]; Drapeau, Pierre [Abstract] [Full Text]
E: Ebersberger, Andrea [Abstract] [Full Text]; Essick, G. K. [Abstract] [Full Text]
F: Favorov, O. [Abstract] [Full Text]; Fickbohm, David J. [Abstract] [Full Text]; Fitzgerald, Kent K. [Abstract] [Full Text]; French, Andrew S. [Abstract] [Full Text]; Freund, Hans-Joachim [Abstract] [Full Text]; Fuchs, Albert F. [Abstract] [Full Text]
G: Gallagher, Joel P. [Abstract] [Full Text]; Gebhart, G. F. [Abstract] [Full Text]; Gelnar, Patricia A. [Abstract] [Full Text]; Gonsalves, Gregory G. [Abstract] [Full Text]; Goossens, H.H.L.M. [Abstract] [Full Text]; Grover, Lawrence M. [Abstract] [Full Text]; Guenther, S. [Abstract] [Full Text]
H: Hallett, Mark [Abstract] [Full Text]; Hartveit, Espen [Abstract] [Full Text]; Hase, K. [Abstract] [Full Text]; Hasselmo, Michael E. [Abstract] [Full Text]; Haydon, Philip G. [Abstract] [Full Text]; Herchenroder, P. A. [Abstract] [Full Text]; Hjelmstad, Gregory O. [Abstract] [Full Text]; Höger, Ulli [Abstract] [Full Text]; Honda, Manabu [Abstract] [Full Text]
I: Ibañez, Vicente [Abstract] [Full Text]; Imoto, Toshiaki [Abstract] [Full Text]; Isaac, John T. R. [Abstract] [Full Text]; Izawa, Y. [Abstract] [Full Text]
J: Jiang, M. C. [Abstract] [Full Text]; Johnson, K. O. [Abstract] [Full Text]; Johnson, K. O. [Abstract] [Full Text]; Joris, Philip X. [Abstract] [Full Text]
K: Kearney, Robert E. [Abstract] [Full Text]; Kleene, Steven J. [Abstract] [Full Text]; Kogo, Naoki [Abstract] [Full Text]; Krauss, Beth R. [Abstract] [Full Text]; Kress, M. [Abstract] [Full Text]
L: Laporte, Yves [Abstract] [Full Text]; Lee, C.-J. [Abstract] [Full Text]; Leigh, R. John [Abstract] [Full Text]; Lestienne, R. [Abstract] [Full Text]; Linster, Christiane [Abstract] [Full Text]; Litovsky, Ruth Y. [Abstract] [Full Text]; Liu, L. [Abstract] [Full Text]; Lortie, Mireille [Abstract] [Full Text]
M: Madison, Daniel V. [Abstract] [Full Text]; Malenka, Robert C. [Abstract] [Full Text]; McCrea, R. A. [Abstract] [Full Text]; Merriam, Laura A. [Abstract] [Full Text]; Mills, Linda R. [Abstract] [Full Text]; Mooney, Richard [Abstract] [Full Text]
N: Nakhle, B. [Abstract] [Full Text]; Nebe, Johannes [Abstract] [Full Text]; Nguyen, Peter V. [Abstract] [Full Text]; Nicoll, Roger A. [Abstract] [Full Text]; Ninomiya, Yuzo [Abstract] [Full Text]; Noto, Christopher T. [Abstract] [Full Text]
O: Olausson, H. [Abstract] [Full Text]; Oram, M. W. [Abstract] [Full Text]
P: Parnas, H. [Abstract] [Full Text]; Parnas, I. [Abstract] [Full Text]; Parpura, Vladimir [Abstract] [Full Text]; Parsons, Rodney L. [Abstract] [Full Text]; Pavlidis, Paul [Abstract] [Full Text]; Pelletier, Marc R. [Abstract] [Full Text]; Petit, Julien [Abstract] [Full Text]; Ploner, Markus [Abstract] [Full Text]; Prior, Chris [Abstract] [Full Text]
R: Ravin, R. [Abstract] [Full Text]; Richmond, B. J. [Abstract] [Full Text]
S: Sadato, Norihiro [Abstract] [Full Text]; Sanes, Dan H. [Abstract] [Full Text]; Saver, Michelle A. [Abstract] [Full Text]; Schaible, Hans-Georg [Abstract] [Full Text]; Schmitz, Frank [Abstract] [Full Text]; Schnitzler, Alfons [Abstract] [Full Text]; Sekizawa, Shin-Ichi [Abstract] [Full Text]; Shenoy, Krishna V. [Abstract] [Full Text]; Shinoda, Y. [Abstract] [Full Text]; Shofner, William P. [Abstract] [Full Text]; Smith, David V. [Abstract] [Full Text]; Spira, M. E. [Abstract] [Full Text]; Spiro, John E. [Abstract] [Full Text]; St. John, Steven J. [Abstract] [Full Text]; Stein, R. B. [Abstract] [Full Text]; Stein, Richard B. [Abstract] [Full Text]; Sugimura, Tadataka [Abstract] [Full Text]; Sugiuchi, Y. [Abstract] [Full Text]; Syed, Naweed I. [Abstract] [Full Text]; Szeverenyi, Nikolaus M. [Abstract] [Full Text]
T: Tommerdahl, M. [Abstract] [Full Text]; Torkkeli, Päivi H. [Abstract] [Full Text]; Trudeau, Louis-Eric [Abstract] [Full Text]
V: Vallbo, Å. B. [Abstract] [Full Text]; van Opstal, A. J. [Abstract] [Full Text]; Vanegas, Horacio [Abstract] [Full Text]; Vega-Bermudez, F. [Abstract] [Full Text]; Vega-Bermudez, F. [Abstract] [Full Text]
W: Wadia, Jehangir S. [Abstract] [Full Text]; Watanabe, Shoji [Abstract] [Full Text]; Wessberg, J. [Abstract] [Full Text]; Whitsel, B. L. [Abstract] [Full Text]; Wiener, M. C. [Abstract] [Full Text]; Wilkens, Jerrel L. [Abstract] [Full Text]; Willard, Alan L. [Abstract] [Full Text]; Wolpaw, J. R. [Abstract] [Full Text]; Wong, Robert K. S. [Abstract] [Full Text]; Wu, Shu Hui [Abstract] [Full Text]; Wyble, Bradley P. [Abstract] [Full Text]
Y: Yamada, Kei [Abstract] [Full Text]; Yan, Chen [Abstract] [Full Text]; Yen, J. C. [Abstract] [Full Text]; Yin, Tom C. T. [Abstract] [Full Text]; Young, Steven R. [Abstract] [Full Text]; Yu, Baojian [Abstract] [Full Text]