JN -- Index by Author (Aug 1999; Volume 82, Number 2)

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Index by Author: Aug 1999; 82 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Agid, Yves [Abstract] [Full Text]; Anzai, Akiyuki [Abstract] [Full Text]; Anzai, Akiyuki [Abstract] [Full Text]; Anzai, Akiyuki [Abstract] [Full Text]; Arshavsky, Y. I. [Abstract] [Full Text]; Avoli, Massimo [Abstract] [Full Text]
B: Baker, J. F. [Abstract] [Full Text]; Barman, Susan M. [Abstract] [Full Text]; Bauer, Eric E. [Abstract] [Full Text]; Beck, Heinz [Abstract] [Full Text]; Bennett, David J. [Abstract] [Full Text]; Blankenship, J. E. [Abstract] [Full Text]; Boyle, R. [Abstract] [Full Text]; Branchereau, Pascal [Abstract] [Full Text]
C: Cabelguen, Jean-Marie [Abstract] [Full Text]; Caprio, J. [Abstract] [Full Text]; Caulfield, B. [Abstract] [Full Text]; Chen, Huan-Xin [Abstract] [Full Text]; Conway, Bernard A. [Abstract] [Full Text]; Craig, A. D. [Abstract] [Full Text]
D: Davies, Philip J. [Abstract] [Full Text]; Davis, Kevin A. [Abstract] [Full Text]; Deliagina, T. G. [Abstract] [Full Text]; Delvolvé, Isabelle [Abstract] [Full Text]; Doya, Kenji [Abstract] [Full Text]; Dubuc, Réjean [Abstract] [Full Text]
E: Eken, Torsten [Abstract] [Full Text]; Elger, Christian E. [Abstract] [Full Text]; Everill, Brian [Abstract] [Full Text]
F: Farmer, Simon F. [Abstract] [Full Text]; Freeman, Ralph D. [Abstract] [Full Text]; Freeman, Ralph D. [Abstract] [Full Text]; Freeman, Ralph D. [Abstract] [Full Text]; Fuchs, Albert F. [Abstract] [Full Text]; Fukushima, Junko [Abstract] [Full Text]; Fukushima, Kikuro [Abstract] [Full Text]
G: Gao, Xiao-Bing [Abstract] [Full Text]; Garrett, M. [Abstract] [Full Text]; Gaymard, Bertrand M. [Abstract] [Full Text]; Gebber, Gerard L. [Abstract] [Full Text]; Giesler, G. J., Jr. [Abstract] [Full Text]; Gokin, A. P. [Abstract] [Full Text]; Goldberg, Stephen J. [Abstract] [Full Text]; Goldstein, Herschel P. [Abstract] [Full Text]; Gorassini, Monica [Abstract] [Full Text]; Graybiel, Ann M. [Abstract] [Full Text]; Guthrie, Barton L. [Abstract] [Full Text]
H: Halliday, David M. [Abstract] [Full Text]; Hanakawa, Toru [Abstract] [Full Text]; Heinemann, Uwe [Abstract] [Full Text]; Highstein, S. M. [Abstract] [Full Text]; Hikosaka, Okihide [Abstract] [Full Text]; Honda, C. N. [Abstract] [Full Text]; Hounsgaard, Jørn [Abstract] [Full Text]; Hsia, Albert Y. [Abstract] [Full Text]; Hultborn, Hans [Abstract] [Full Text]
I: Inoue, Tomio [Abstract] [Full Text]; Ireland, David R. [Abstract] [Full Text]; Iribe, Yuji [Abstract] [Full Text]; Isa, Tadashi [Abstract] [Full Text]; Itoh, Satsuki [Abstract] [Full Text]; Iwamoto, Y. [Abstract] [Full Text]
K: Kaneko, Chris R. S. [Abstract] [Full Text]; Kang, Youngnam [Abstract] [Full Text]; Katz, Donald B. [Abstract] [Full Text]; Kawato, Mitsuo [Abstract] [Full Text]; Kerr, T. [Abstract] [Full Text]; Kiehn, Ole [Abstract] [Full Text]; Kiehn, Ole [Abstract] [Full Text]; Kimura, Minoru [Abstract] [Full Text]; Kjaerulff, Ole [Abstract] [Full Text]; Klug, Achim [Abstract] [Full Text]; Kobayashi, Masayuki [Abstract] [Full Text]; Kocsis, Jeffery D. [Abstract] [Full Text]; Kössl, M. [Abstract] [Full Text]; Kriegstein, Arnold R. [Abstract] [Full Text]; Kujawa, Sharon G. [Abstract] [Full Text]; Kurcewicz, Irène [Abstract] [Full Text]
L: Laurienti, P. J. [Abstract] [Full Text]; Lefèvre, Philippe [Abstract] [Full Text]; Lewis, Craig [Abstract] [Full Text]; Lewis, Richard F. [Abstract] [Full Text]; Liberman, M. Charles [Abstract] [Full Text]; Lisman, John [Abstract] [Full Text]; Liu, Qing-Song [Abstract] [Full Text]; Liu, Xiaolin [Abstract] [Full Text]; Lledo, Pierre-Marie [Abstract] [Full Text]; Louvel, Jacques [Abstract] [Full Text]
M: Maki, Shinichiro [Abstract] [Full Text]; Martinez-Pinna, Juan [Abstract] [Full Text]; Matsumoto, Naoyuki [Abstract] [Full Text]; Matsuo, Ryuji [Abstract] [Full Text]; McClung, J. Ross [Abstract] [Full Text]; McDearmid, Jonathan R. [Abstract] [Full Text]; McLachlan, Elspeth M. [Abstract] [Full Text]; McMahon, Douglas G. [Abstract] [Full Text]; Merlin, Lisa R. [Abstract] [Full Text]; Merriam, Laura A. [Abstract] [Full Text]; Miall, R. C. [Abstract] [Full Text]; Moody, Aaron [Abstract] [Full Text]; Moore, Kevin [Abstract] [Full Text]; Moore, L. E. [Abstract] [Full Text]; Morgan, S. L. [Abstract] [Full Text]; Morimoto, Toshifumi [Abstract] [Full Text]; Motalli, Rita [Abstract] [Full Text]
N: Nakamura, Kae [Abstract] [Full Text]; Nelken, Israel [Abstract] [Full Text]; Nicolelis, Miguel A. L. [Abstract] [Full Text]; Norrsell, U. [Abstract] [Full Text]
O: Ogawa, K. [Abstract] [Full Text]; Ohzawa, Izumi [Abstract] [Full Text]; Ohzawa, Izumi [Abstract] [Full Text]; Ohzawa, Izumi [Abstract] [Full Text]; Oleskevich, Sharon [Abstract] [Full Text]; Optican, Lance M. [Abstract] [Full Text]; Orlovsky, G. N. [Abstract] [Full Text]; Otmakhov, Nikolai [Abstract] [Full Text]; Owens, David F. [Abstract] [Full Text]
P: Pang, Kevin C. H. [Abstract] [Full Text]; Parsons, Rodney L. [Abstract] [Full Text]; Passingham, R. E. [Abstract] [Full Text]; Patrylo, Peter R. [Abstract] [Full Text]; Perkins, Katherine L. [Abstract] [Full Text]; Perlmutter, S. I. [Abstract] [Full Text]; Perrier, Jean-François [Abstract] [Full Text]; Peterson, B. W. [Abstract] [Full Text]; Pichon, Y. [Abstract] [Full Text]; Pierrot-Deseilligny, Charles [Abstract] [Full Text]; Ploner, Christoph J. [Abstract] [Full Text]; Pollak, George D. [Abstract] [Full Text]; Populin, Luis C. [Abstract] [Full Text]; Powers, R. K. [Abstract] [Full Text]; Prime, L. [Abstract] [Full Text]; Puil, Ernest [Abstract] [Full Text]; Pumain, René [Abstract] [Full Text]
Q: Quaia, Christian [Abstract] [Full Text]; Quintero, Jorge E. [Abstract] [Full Text]
R: Raasch, Christine C. [Abstract] [Full Text]; Rabbitt, R. D. [Abstract] [Full Text]; Rhode, William S. [Abstract] [Full Text]; Rivaud-Péchoux, Sophie [Abstract] [Full Text]; Rosenberg, Jay R. [Abstract] [Full Text]; Russell, I. J. [Abstract] [Full Text]
S: Saito, Yasuhiko [Abstract] [Full Text]; Sakai, Katsuyuki [Abstract] [Full Text]; Schwarz, Dietrich W. F. [Abstract] [Full Text]; Schweighofer, Nicolas [Abstract] [Full Text]; Scornik, Fabiana S. [Abstract] [Full Text]; Selverston, A. I. [Abstract] [Full Text]; Sillar, Keith T. [Abstract] [Full Text]; Simon, S. A. [Abstract] [Full Text]; Spirou, George A. [Abstract] [Full Text]; Steffens, Ralf [Abstract] [Full Text]; Stein, J. F. [Abstract] [Full Text]; Sutlive, Thomas G. [Abstract] [Full Text]
T: Tancredi, Virginia [Abstract] [Full Text]; Tennigkeit, Frank [Abstract] [Full Text]; Tepper, James M. [Abstract] [Full Text]; Teyler, T. J. [Abstract] [Full Text]; Türker, K. S. [Abstract] [Full Text]
V: van den Pol, Anthony N. [Abstract] [Full Text]; van Donkelaar, P. [Abstract] [Full Text]; Vincent, Jean-Didier [Abstract] [Full Text]
W: Wakisaka, Satoshi [Abstract] [Full Text]; Wan-Chow-Wah, Doreen [Abstract] [Full Text]; Wenk, H. N. [Abstract] [Full Text]
Y: Yin, Tom C. T. [Abstract] [Full Text]; Young, Eric D. [Abstract] [Full Text]
Z: Zajac, Felix E. [Abstract] [Full Text]; Zee, David S. [Abstract] [Full Text]; Zhang, X. [Abstract] [Full Text]; Zhong, Sheng [Abstract] [Full Text]