JN -- Index by Author (Oct 2000; Volume 84, Number 4)

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Year:		Vol:		Page:

Index by Author: Oct 2000; 84 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adams, David J. [Abstract] [Full Text]; Ali, Declan W. [Abstract] [Full Text]; Almeida, Gil Lúcio [Abstract] [Full Text]; Amador, Nelly [Abstract] [Full Text]; Angelaki, Dora E. [Abstract] [Full Text]; Asano, Tomoko [Abstract] [Full Text]
B: Baker, Stuart N. [Abstract] [Full Text]; Blight, Andrew R. [Abstract] [Full Text]; Brand, Antje [Abstract] [Full Text]; Burstein, Rami [Abstract] [Full Text]
C: Cai, R. [Abstract] [Full Text]; Carstens, E. [Abstract] [Full Text]; Cooper, Scott E. [Abstract] [Full Text]; Corcos, Daniel M. [Abstract] [Full Text]; Cox, C. L. [Abstract] [Full Text]; Crepps, B. [Abstract] [Full Text]; Cuevas, Javier [Abstract] [Full Text]
D: Deboer, Tom [Abstract] [Full Text]; Desmond, Nancy L [Abstract] [Full Text]; Dessirier, J.-M. [Abstract] [Full Text]; Dickman, J. David [Abstract] [Full Text]; Ditterich, J. [Abstract] [Full Text]; DiZio, Paul [Abstract] [Full Text]; Drapeau, Pierre [Abstract] [Full Text]; Dürr, Volker [Abstract] [Full Text]
E: Ebner, Alois [Abstract] [Full Text]; Ebner, Ford F. [Abstract] [Full Text]; Egelhaaf, Martin [Abstract] [Full Text]; Eggert, T. [Abstract] [Full Text]; Egli, Mark [Abstract] [Full Text]
F: Feigenspan, Andreas [Abstract] [Full Text]; Furue, Hidemasa [Abstract] [Full Text]
G: Gao, Keming [Abstract] [Full Text]; Gerstein, George L. [Abstract] [Full Text]; Ghez, Claude [Abstract] [Full Text]; Gilbert, Charles D. [Abstract] [Full Text]; Glickstein, Mitchell [Abstract] [Full Text]; Gnadt, J. W. [Abstract] [Full Text]; Goodyear, Bradley G. [Abstract] [Full Text]; Gorji, Ali [Abstract] [Full Text]; Grasso, R. [Abstract] [Full Text]; Grothe, Benedikt [Abstract] [Full Text]; Gustincich, Stefano [Abstract] [Full Text]
H: Haberberger, Rainer [Abstract] [Full Text]; Hajnik, T. [Abstract] [Full Text]; Halmos, Katalin Cs. [Abstract] [Full Text]; Hasan, Ziaul [Abstract] [Full Text]; Hedberg, Thomas G. [Abstract] [Full Text]; Höhling, Jörg-Michael [Abstract] [Full Text]; Huber, Reto [Abstract] [Full Text]; Humphrey, G. Keith [Abstract] [Full Text]
I: Ivanenko, Y. P. [Abstract] [Full Text]
J: Jenkinson, Edward W. [Abstract] [Full Text]; Jones, Helen E. [Abstract] [Full Text]
K: Kaas, Jon H. [Abstract] [Full Text]; Kaneko, Akimichi [Abstract] [Full Text]; Kapadia, Mitesh K. [Abstract] [Full Text]; Kettner, R. E. [Abstract] [Full Text]; Kimura, Akihisa [Abstract] [Full Text]; Kirkland, Kyle L. [Abstract] [Full Text]; Köhling, Rüdiger [Abstract] [Full Text]; Koizumi, Amane [Abstract] [Full Text]; Konishi, Shiro [Abstract] [Full Text]; Konishi, Shiro [Abstract] [Full Text]; Korenbrot, Juan I. [Abstract] [Full Text]; Kress, Michaela [Abstract] [Full Text]; Kuhlmann, Dieter [Abstract] [Full Text]; Kuhnt, Ulrich [Abstract] [Full Text]; Kumamoto, Eiichi [Abstract] [Full Text]; Kummer, Wolfgang [Abstract] [Full Text]; Kurtz, Rafael [Abstract] [Full Text]
L: Lackner, James R. [Abstract] [Full Text]; Lacquaniti, F. [Abstract] [Full Text]; Lai, Y. Y. [Abstract] [Full Text]; Legendre, Pascal [Abstract] [Full Text]; Lemon, Roger N. [Abstract] [Full Text]; Leung, H.-C. [Abstract] [Full Text]; Levy, William B [Abstract] [Full Text]; Lisberger, Stephen G. [Abstract] [Full Text]; Luther, Jason A. [Abstract] [Full Text]
M: Malick, Amy [Abstract] [Full Text]; Martin, John H. [Abstract] [Full Text]; Mason, J. L. [Abstract] [Full Text]; Mason, Peggy [Abstract] [Full Text]; Matsunaga, Shinya [Abstract] [Full Text]; Menon, Ravi S. [Abstract] [Full Text]; Merfeld, D. M. [Abstract] [Full Text]; Moshé, Solomon L. [Abstract] [Full Text]; Müller, Michael [Abstract] [Full Text]
N: Narikawa, Keita [Abstract] [Full Text]; Newell, Karl M. [Abstract] [Full Text]; Nicolle, David A. [Abstract] [Full Text]
O: Olson, Andrew J. [Abstract] [Full Text]
P: Pannek, Heinz-Wolfgang [Abstract] [Full Text]; Pavlides, Constantine [Abstract] [Full Text]; Perl, E. R. [Abstract] [Full Text]; Peterka, R. J. [Abstract] [Full Text]; Picones, Arturo [Abstract] [Full Text]
Q: Qi, Hui-Xin [Abstract] [Full Text]
R: Ramcharan, E. J. [Abstract] [Full Text]; Raviola, Elio [Abstract] [Full Text]; Roberts, Patrick D. [Abstract] [Full Text]
S: Sachdev, Robert N. S. [Abstract] [Full Text]; Saitow, Fumihito [Abstract] [Full Text]; Saitow, Fumihito [Abstract] [Full Text]; Satake, Shin'Ichiro [Abstract] [Full Text]; Schlag, John [Abstract] [Full Text]; Schlag-Rey, Madeleine [Abstract] [Full Text]; Scholz, Reas [Abstract] [Full Text]; Shea, V. K. [Abstract] [Full Text]; Sherman, S. M. [Abstract] [Full Text]; Shi, Riyi [Abstract] [Full Text]; Shima, Keisetsu [Abstract] [Full Text]; Siegel, J. M. [Abstract] [Full Text]; Sillito, Adam M. [Abstract] [Full Text]; Simons, C. T. [Abstract] [Full Text]; Slifkin, Andrew B. [Abstract] [Full Text]; Somjen, George G. [Abstract] [Full Text]; Speckmann, Erwin-Josef [Abstract] [Full Text]; Sperber, Ellen F. [Abstract] [Full Text]; Stepniewska, Iwona [Abstract] [Full Text]; Stocker, Jonathan W. [Abstract] [Full Text]; Stonecypher, Mark [Abstract] [Full Text]; Strassman, Rew M. [Abstract] [Full Text]; Straub, Heidrun [Abstract] [Full Text]; Straube, A. [Abstract] [Full Text]; Sudo, M. [Abstract] [Full Text]; Sudo, S. [Abstract] [Full Text]; Suh, M. [Abstract] [Full Text]
T: Tanaka, Masaki [Abstract] [Full Text]; Tanji, Jun [Abstract] [Full Text]; Tasker, Jeffrey G. [Abstract] [Full Text]; Tobler, Irene [Abstract] [Full Text]; Tuxhorn, Ingrid [Abstract] [Full Text]
U: Urban, Reas [Abstract] [Full Text]
V: Vaillancourt, David E. [Abstract] [Full Text]; Velísková, Jana [Abstract] [Full Text]; Vining, Neil C. [Abstract] [Full Text]
W: Watanabe, Shu-Ichi [Abstract] [Full Text]; West, David C. [Abstract] [Full Text]; Westheimer, Gerald [Abstract] [Full Text]; Wiley, Ronald G. [Abstract] [Full Text]; Wolf, Peter [Abstract] [Full Text]
Y: Yamada, Junko [Abstract] [Full Text]; Yoshimura, Megumu [Abstract] [Full Text]
Z: Zamani, M. Reza [Abstract] [Full Text]; Zhan, X. J. [Abstract] [Full Text]; Zupan, L. H. [Abstract] [Full Text]