JN -- Index by Author (Dec 2000; Volume 84, Number 6)

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Index by Author: Dec 2000; 84 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abel, Ted [Abstract] [Full Text]; Alexeeva, V. [Abstract] [Full Text]; Angelaki, Dora E. [Abstract] [Full Text]; Ashburner, J. [Abstract] [Full Text]
B: Barrionuevo, German [Abstract] [Full Text]; Bausch, Suzanne B. [Abstract] [Full Text]; Bonnot, Agnes [Abstract] [Full Text]; Bringmann, A. [Abstract] [Full Text]; Büschges, A. [Abstract] [Full Text]
C: Cameron, Jill S. [Abstract] [Full Text]; Chen, Ping-Sun [Abstract] [Full Text]; Chi, Xian Xuan [Abstract] [Full Text]; Cohen, Bernard [Abstract] [Full Text]; Cropper, E. C. [Abstract] [Full Text]
D: Dahlstedt, Seth [Abstract] [Full Text]; Delgado, M. R. [Abstract] [Full Text]; Deliagina, T. G. [Abstract] [Full Text]; Donato, Roberta [Abstract] [Full Text]; Dryer, Stuart E. [Abstract] [Full Text]; Duffy, Steven N. [Abstract] [Full Text]
E: El Manira, A. [Abstract] [Full Text]
F: Fan, Yi-Ping [Abstract] [Full Text]; Faure, Philippe [Abstract] [Full Text]; Ferrera, Vincent P. [Abstract] [Full Text]; Fiez, J. A. [Abstract] [Full Text]; Fissell, C. [Abstract] [Full Text]
G: Gielen, C.C.A.M. [Abstract] [Full Text]; Golarai, G. [Abstract] [Full Text]; González-Burgos, Guillermo R. [Abstract] [Full Text]; Grillner, S. [Abstract] [Full Text]; Grillner, S. [Abstract] [Full Text]; Gutiérrez, Rafael [Abstract] [Full Text]
H: Henze, Darrell A. [Abstract] [Full Text]; Hess, Bernhard J. M. [Abstract] [Full Text]; Hillsley, K. [Abstract] [Full Text]; Horn, Eric M. [Abstract] [Full Text]; Hurwitz, I. [Abstract] [Full Text]
J: Jen, Philip H.-S. [Abstract] [Full Text]; Jenmalm, Per [Abstract] [Full Text]; Johansson, Roland S. [Abstract] [Full Text]; Josephs, O. [Abstract] [Full Text]
K: Kahlon, Maninder [Abstract] [Full Text]; Kannan, Hiroshi [Abstract] [Full Text]; Kaplan, Daniel [Abstract] [Full Text]; Kenyon, J. L. [Abstract] [Full Text]; Kimelberg, Harold K. [Abstract] [Full Text]; King, Anthony P. J. [Abstract] [Full Text]; Kirk, Mark D. [Abstract] [Full Text]; Kondoh, Takashi [Abstract] [Full Text]; Korn, Henri [Abstract] [Full Text]; Kunitake, Takato [Abstract] [Full Text]; Kupfermann, I. [Abstract] [Full Text]
L: Lewis, David A. [Abstract] [Full Text]; Li, Yongsheng [Abstract] [Full Text]; Lisberger, Stephen G. [Abstract] [Full Text]; Lynch, M. [Abstract] [Full Text]; Lysakowski, Anna [Abstract] [Full Text]
M: Macdonald, Robert L. [Abstract] [Full Text]; Marcar, V. L. [Abstract] [Full Text]; McNamara, James O. [Abstract] [Full Text]; Medendorp, W. P. [Abstract] [Full Text]; Mellon, DeForest, Jr. [Abstract] [Full Text]; Minor, Lloyd B. [Abstract] [Full Text]
N: Nässel, Dick R. [Abstract] [Full Text]; Neelands, Torben R. [Abstract] [Full Text]; Neugebauer, Volker [Abstract] [Full Text]; Nguyen, Peter V. [Abstract] [Full Text]; Nishijo, Hisao [Abstract] [Full Text]; Nistri, Andrea [Abstract] [Full Text]; Noll, D. C. [Abstract] [Full Text]; Nystrom, L. E. [Abstract] [Full Text]
O: O'Donovan, Michael J. [Abstract] [Full Text]; Ono, Taketoshi [Abstract] [Full Text]; Orban, G. A. [Abstract] [Full Text]; Orlovsky, G. N. [Abstract] [Full Text]; Oxford, Gerry S. [Abstract] [Full Text]
P: Passingham, R. E. [Abstract] [Full Text]
R: Raiguel, S. E. [Abstract] [Full Text]; Ramnani, N. [Abstract] [Full Text]; Raphan, Theodore [Abstract] [Full Text]; Reichenbach, A. [Abstract] [Full Text]
S: Sánchez, José Antonio D. [Abstract] [Full Text]; Sayin, Ü. [Abstract] [Full Text]; Schopf, S. [Abstract] [Full Text]; Smith, T. K. [Abstract] [Full Text]; Susswein, A. J. [Abstract] [Full Text]; Sutula, T. [Abstract] [Full Text]
T: Tamura, Ryoi [Abstract] [Full Text]; Toni, I. [Abstract] [Full Text]; Torii, Kunio [Abstract] [Full Text]
U: Urban, Nathaniel N. [Abstract] [Full Text]
V: Van Gisbergen, J.A.M. [Abstract] [Full Text]; Van Pelt, S. [Abstract] [Full Text]; Vilim, F. S. [Abstract] [Full Text]
W: Waldrop, Tony G. [Abstract] [Full Text]; Wang, Haibin [Abstract] [Full Text]; Wegener, Christian [Abstract] [Full Text]; Weiss, K. R. [Abstract] [Full Text]; Whelan, Patrick [Abstract] [Full Text]; Wikström, M. A. [Abstract] [Full Text]; Willis, William D. [Abstract] [Full Text]; Wilson, Donald A. [Abstract] [Full Text]; Woo, Newton H. [Abstract] [Full Text]
X: Xiao, D. [Abstract] [Full Text]; Xu, Zao C. [Abstract] [Full Text]
Y: Yakushin, Sergei B. [Abstract] [Full Text]
Z: Zelenin, P. V. [Abstract] [Full Text]; Zhou, Min [Abstract] [Full Text]; Zhou, Xiaoming [Abstract] [Full Text]