JN -- Index by Author (Jun 2003; Volume 89, Number 6)

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Index by Author: Jun 2003; 89 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aguilar, Juan [Abstract] [Full Text]; Alexeeva, V. [Abstract] [Full Text]; Aronov, Dmitriy [Abstract] [Full Text]; Ase, Ariel [Abstract] [Full Text]
B: Barbay, S. [Abstract] [Full Text]; Boivin, Michel [Abstract] [Full Text]; Breteler, Mary D. Klein [Abstract] [Full Text]; Broussard, Dianne M. [Abstract] [Full Text]; Buño, Washington [Abstract] [Full Text]; Bushnell, M. Catherine [Abstract] [Full Text]
C: Canedo, Antonio [Abstract] [Full Text]; Cangiano, Lorenzo [Abstract] [Full Text]; Carro, Eva [Abstract] [Full Text]; Cho, Caroline [Abstract] [Full Text]; Clarke, Robert J. [Abstract] [Full Text]; Clarke, Robert J. [Abstract] [Full Text]; Costello, D. A. [Abstract] [Full Text]; Cowey, Alan [Abstract] [Full Text]; Crawford, J. Douglas [Abstract] [Full Text]; Cui, He [Abstract] [Full Text]
D: De-Doncker, Laurent [Abstract] [Full Text]; Dembrow, N. C. [Abstract] [Full Text]; DiCarlo, James J. [Abstract] [Full Text]; Dill, Natalie [Abstract] [Full Text]; Duncan, Gary H. [Abstract] [Full Text]
E: Ekeberg, Örjan [Abstract] [Full Text]; Ellis, T. A. [Abstract] [Full Text]; Evdokimidis, Ioannis [Abstract] [Full Text]
F: Fagergren, Anders [Abstract] [Full Text]; Falempin, Maurice [Abstract] [Full Text]; Farrow, Karl [Abstract] [Full Text]; Flanders, Martha [Abstract] [Full Text]; Forssberg, Hans [Abstract] [Full Text]; Frazier, Charles J. [Abstract] [Full Text]; Freir, D. B. [Abstract] [Full Text]; Freir, D. B. [Abstract] [Full Text]; Friel, K. M. [Abstract] [Full Text]; Frost, S. B. [Abstract] [Full Text]; Fu, Wen [Abstract] [Full Text]; Fujisawa, Y. [Abstract] [Full Text]; Furukawa, Y. [Abstract] [Full Text]
G: Gamlin, Paul D. R. [Abstract] [Full Text]; Gamlin, Paul D. R. [Abstract] [Full Text]; Granseth, Björn [Abstract] [Full Text]; Grillner, Sten [Abstract] [Full Text]; Gu, Jianguo G. [Abstract] [Full Text]; Gu, Jianguo G. [Abstract] [Full Text]; Gutiérrez, Rafael [Abstract] [Full Text]
H: Harris, Kim H. [Abstract] [Full Text]; Harvey, John R. [Abstract] [Full Text]; Hentall, Ian D. [Abstract] [Full Text]; Herron, C. E. [Abstract] [Full Text]; Herron, C. E. [Abstract] [Full Text]; Hondzinski, Jan M. [Abstract] [Full Text]
J: Jhamandas, Jack H. [Abstract] [Full Text]; Jing, J. [Abstract] [Full Text]; Juan, Chi-Hung [Abstract] [Full Text]
K: Karandreas, Nikos [Abstract] [Full Text]; Kornylo, Krista [Abstract] [Full Text]; Krauss, Greg [Abstract] [Full Text]; Krauzlis, Richard J. [Abstract] [Full Text]
L: Larkum, Matthew E. [Abstract] [Full Text]; Lenz, Fred A. [Abstract] [Full Text]; Li, L. [Abstract] [Full Text]; Lindström, Sivert [Abstract] [Full Text]; Ling, Jennifer X. [Abstract] [Full Text]; Liu, Yinghui [Abstract] [Full Text]; Lnenicka, Gregory A. [Abstract] [Full Text]
M: Macpherson, Ewan A. [Abstract] [Full Text]; MacTavish, David [Abstract] [Full Text]; Malpeli, Joseph G. [Abstract] [Full Text]; Manis, Paul B. [Abstract] [Full Text]; Manis, Paul B. [Abstract] [Full Text]; Manis, Paul B. [Abstract] [Full Text]; Maqueda, Jasmín [Abstract] [Full Text]; Martín, Eduardo D. [Abstract] [Full Text]; Martinez-Trujillo, Julio C. [Abstract] [Full Text]; Matsushima, O. [Abstract] [Full Text]; Maunsell, John H. R. [Abstract] [Full Text]; McCormick, David A. [Abstract] [Full Text]; Mechler, Ferenc [Abstract] [Full Text]; Mesigil, Riza [Abstract] [Full Text]; Mickey, Brian J. [Abstract] [Full Text]; Middlebrooks, John C. [Abstract] [Full Text]; Minakata, H. [Abstract] [Full Text]; Momose-Sato, Yoko [Abstract] [Full Text]; Morales, Miguel A. [Abstract] [Full Text]; Morishita, F. [Abstract] [Full Text]; Muggleton, Neil G. [Abstract] [Full Text]; Müri, Rene M. [Abstract] [Full Text]
N: Nakamaru, K. [Abstract] [Full Text]; Nakatsuka, Terumasa [Abstract] [Full Text]; Nakatsuka, Terumasa [Abstract] [Full Text]; Noga, Brian R. [Abstract] [Full Text]; Nudo, R. J. [Abstract] [Full Text]; Nuñez, Angel [Abstract] [Full Text]
O: Ohta, S. [Abstract] [Full Text]
P: Papke, Roger L. [Abstract] [Full Text]; Petit, Julien [Abstract] [Full Text]; Picquet, Florence [Abstract] [Full Text]; Pinzon, Alberto [Abstract] [Full Text]; Plautz, E. J. [Abstract] [Full Text]; Port, John D. [Abstract] [Full Text]
R: Raggio, Marcia W. [Abstract] [Full Text]; Ramirez, Jan-Marino [Abstract] [Full Text]; Reich, Daniel S. [Abstract] [Full Text]; Rivadulla, Casto [Abstract] [Full Text]; Romo-Parra, Héctor [Abstract] [Full Text]; Roth, Arnd [Abstract] [Full Text]; Rothman, Jason S. [Abstract] [Full Text]; Rothman, Jason S. [Abstract] [Full Text]; Rothman, Jason S. [Abstract] [Full Text]; Rumpal, Nidhi [Abstract] [Full Text]
S: Saenz, Melissa [Abstract] [Full Text]; Sakmann, Bert [Abstract] [Full Text]; Sanchez-Vives, Maria V. [Abstract] [Full Text]; Sasaki, K. [Abstract] [Full Text]; Sato, Katsushige [Abstract] [Full Text]; Schaefer, Andreas T. [Abstract] [Full Text]; Schreiner, Christoph E. [Abstract] [Full Text]; Séguéla, Philippe [Abstract] [Full Text]; She, Jin-Xiong [Abstract] [Full Text]; Smyrnis, Nikolaos [Abstract] [Full Text]; Solaiyappan, Meiyappan [Abstract] [Full Text]; Sonobe, Hideki [Abstract] [Full Text]; Soto, Cristina [Abstract] [Full Text]; Spruston, Nelson [Full Text]; Stecker, G. Christopher [Abstract] [Full Text]; Strigo, Irina A. [Abstract] [Full Text]; Strowbridge, Ben W. [Abstract] [Full Text]; Sweedler, J. V. [Abstract] [Full Text]
T: Theleritis, Christos [Abstract] [Full Text]; Torres-Aleman, Ignacio [Abstract] [Full Text]; Treede, Rolf-Detlef [Abstract] [Full Text]; Tryba, Andrew K. [Abstract] [Full Text]; Tsuzuki, Kenzo [Abstract] [Full Text]; Tsuzuki, Kenzo [Abstract] [Full Text]
V: Victor, Jonathan D. [Abstract] [Full Text]; Vilim, F. S. [Abstract] [Full Text]; Vivar, Carmen [Abstract] [Full Text]; Vogalis, Fivos [Abstract] [Full Text]; Vogel, Hagen [Abstract] [Full Text]
W: Walsh, Vincent [Abstract] [Full Text]; Wang, Cong-Yi [Abstract] [Full Text]; Wang, Hongying [Abstract] [Full Text]; Wang, Xiao-Jing [Abstract] [Full Text]; Weiss, K. R. [Abstract] [Full Text]
Z: Zhang, Hongyu [Abstract] [Full Text]; Zhang, Hongyu [Abstract] [Full Text]